Real Time Solutions

Quick guide to Design for In Circuit Testability

Revision: X4

Last updated:7/7/2003

Author: Robert Nussbaum

Preliminary Document – not released

Purpose:

The purpose of this document is to supplement certain DFT/DFM guides and to provide a quick reference for interested parties to avoid the common errors/omissions that are encountered in all aspects of creating electronic assemblies that may hinder the development of an in-circuit test set.

Definitions:

Test point - a non-orthogonally obstructed landing, via or test pad. Obstructions include hardware, solder mask and overhanging components.

LAYOUT

TEST POINTS

POWER NETS (NOT GROUND)

GROUND NETS

ELECTRICAL AND CAD

Board Fabrication and Tolerance

 

Other: