| Current System |
- 1408 fully bi-directional test points
- Synchronized Analog and Digital Subsystems
- All pins have parallel drive and sense
capability
- Computer: Pentium-Pro 200® PC
- Color Monitor on adjustable height platform
|
- Premium Software Support
- Ethernet® Networking Interface
(10baseT/Thinwire)
- Hardware Warranty
- Automatic Vacuum Control for single and dual
well fixtures
- Power Supply Package:
4 power supplies:0-20V@8.0A
2 power supplies: 0-7V@15A
|
| Analog Hardware |
- Measurement Matrix - 8 lines by n pins
- 2 Sources, configurable as current or
voltage
- DC Voltage Source: Programmable, 16 bit, 0
to ± 18V over 4 ranges, to ± 500 mA, programmable current limiting
- DC Current Source: Programmable, 16-bit, 0
to ± 500mA over 8 ranges, to ± 18V, programmable voltage limiting
- DC Voltmeter: 0 to ± 200 V over 9
ranges
- DC Ammeter: 0 to ± 160 mA over 7 ranges
- Reactance Module
- Programmable frequency from .15Hz to 100kHz
- Programmable AC level to 7 Vrms, 12-bit
- Programmable DC offset, 16-bit
|
- Arbitrary Waveform Generator
- True RMS-DC Detection
- Differential Detector/DVM/Digitizer
- Coherent Transfer Function Measurement
- Component Measurement Capability
- Resistive (R) Range: 0.1 to 30 Mohm
- Capacitive (C) Range: 1 pF to 10,000 uf
- Inductive (L) Range: 10 uH to 1000 H
- External Instrument Matrix: 9 BNC's to 8
line to internal
instruments or n pins
- Traceable Calibration Daughterboard
|
| Digital Hardware |
- Common Drive Characteristics
- Range: Dual programmable drive levels
from +10V to -6V
- Automatic drive verification at each
pin. Four voltages
selectable for each pin
- Output Current (with automatic compensation
circuitry)
>500 mA; burst duration typically 60 msec
>40 mA; steady state
Current is automatically reduced from the burst value to steady state value in a
transition time which is a function of the output current
- Typical Output Impedance: <2.0 ohm
|
- Software Programmable Pull-up/Pull-down
loads
- Driver memory: 16K
- Common Sensor Characteristics
- Dual programmable sense thresholds from +10V
to -6V. Sense thresholds independent of programmed drive level
- Input Impedance = 100 Kohm
- Bit by bit compare and CRC capture modes
- Sensor memory: 16K
- Clock Generation/Synchronization
Characteristics
- Clock Generation frequency programmable up
to 20 MHz
- Clock Synchronization frequency programmable
up to 20 MHz
|
| Hardware Options |
- Test Points expandable to 3840
- Each GR2286i pinboard provides 16
driver/sensors and
16 scanners, each multiplexed to 128 hybrid test points
- Each GR2287i pinboard provides 32
driver/sensors and
32 scanners, each multiplexed to 128 hybrid test points
- Power Tilt and Automation-Ready
Configurations
- Deep Serial Memory Instrument
- Analog Functional Test Module
|
- Flexible Power Supply Package
Choose up to 14 power supplies from the following:
0-60V@2.5A, 0-20V@8.0A, 0-7V@15A
- Fixed Power Supplies: +5V@6A, ±15V@1A or
+5V@6A, ±12V@1.3A
- High Voltage Source, configurable as current
or voltage,
programmable voltage limit, ±120V, ±50 mA
- IEEE-488 Interface Controller
- Ethernet Networking Interface
(Thickwire/AUI)
|
| System Software |
- GR228X Test/Debug System Software License
- AutoDebug
- Program Xplorer™ Graphical Real-Time Debug Station
- Automatic Fault Grading
- GR228X Test Execution Software
- Panel-Test™ Test Execution Software
- Memory Bank Test Software
- GR228X Diagnostic Software
- Guided Probe
- SoftProbe™ for automatic diagnosis of open input and output pins on digital ICs
- BusBust® isolates and diagnoses failures of ICs driving a common bus
- Real-Time Data Collection
- Hybrid Test Generator for mixed-signal
applications
- Panel-Test Program Preparation
|
- Opens Xpress™ Vectorless Test Technique
for detecting:
- Open device pins
- Open connector pins
- Polorized capacitor orientation
- Correct device orientation
- Microsoft® Windows License
- Windows NT™ operating system
- Supports standard networking protocols
- ATG XPRESS™ Program Preparation License
- TestFlo™ Program Prep Manager
- CAD/CAE Input Package
- Analog, Digital, Boundary Scan and Mixed-Signal Device Libraries
- Xpress Model™ for automatic device models of nonstandard components
- Circuit Analyzer-Based Test Generator
- Multiple Level Digital Isolation
|
| Software Options Available |
- BasicSCAN™ model generator for boundary
scan devices
- TRACS® III Process Information System
- GRXpert™ converts HP® test programs
and fixtures to GenRad
|
- FS-ATG test generator for PLDs and FPGAs
- Junction Xpress™ vectorless test
technique for detecting
open device pins and marginal solder connections
- Scan Pathfinder™ boundary scan test
generation, execution and diagnostics for boards with a mix of boundary scan and
conventional devices
|
| The following are trademarks or registered
trademarks of their respective companies: Ethernet - Xerox Corp.; HP - Hewlett-Packard
Co.; Microsoft, Windows NT - Microsoft Corporation; Pentium - Intel Corp.; UNIX - Unix
System Laboratories, Inc.; ATG XPRESS, BasicSCAN, BusBust, GRXpert, Junction Xpress, Opens
Xpress, Panel-Test, Program Xplorer, Scan Pathfinder, Softprobe, TestFlo, TRACS, Xpress
Model - GenRad, Inc. |